发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device can prevent etching to a base (N+), and form a film at a relatively high film formation rate. Ž<P>SOLUTION: This method for manufacturing of a semiconductor device includes: a first step of carrying a silicon substrate into a processing chamber; a second step of supplying at least a first silane-based gas and a first etching gas into the processing chamber while heating the silicon substrate; and a third step of supplying at least a second silane-based gas and a second etching gas into the processing chamber while heating the silicon substrate. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009289807(A) 申请公布日期 2009.12.10
申请号 JP20080138091 申请日期 2008.05.27
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 INOKUCHI YASUHIRO;MORIYA ATSUSHI
分类号 H01L21/205 主分类号 H01L21/205
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