发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device can prevent etching to a base (N+), and form a film at a relatively high film formation rate. Ž<P>SOLUTION: This method for manufacturing of a semiconductor device includes: a first step of carrying a silicon substrate into a processing chamber; a second step of supplying at least a first silane-based gas and a first etching gas into the processing chamber while heating the silicon substrate; and a third step of supplying at least a second silane-based gas and a second etching gas into the processing chamber while heating the silicon substrate. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2009289807(A) |
申请公布日期 |
2009.12.10 |
申请号 |
JP20080138091 |
申请日期 |
2008.05.27 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
INOKUCHI YASUHIRO;MORIYA ATSUSHI |
分类号 |
H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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