发明名称 METHODS OF OPERATING A BISTABLE RESISTANCE RANDOM ACCESS MEMORY WITH MULTIPLE MEMORY LAYERS AND MULTILEVEL MEMORY STATES
摘要 A method is described for operating a bistable resistance random access memory having two memory layer stacks that are aligned in series is disclosed. The bistable resistance random access memory comprises two memory layer stacks per memory cell, the bistable resistance random access memory operates in four logic states, a logic "00" state, a logic "01" state, a logic "10" state and a logic "11" state. The relationship between the four different logic states can be represented mathematically by the two variables n and f and a resistance R. The logic "0" state is represented by a mathematical expression (1+f)R. The logic "1" state is represented by a mathematical expression (n+f)R. The logic "2" state is represented by a mathematical expression (1+nf)R. The logic "3" state is represented by a mathematical expression n(1+f)R.
申请公布号 US2009303774(A1) 申请公布日期 2009.12.10
申请号 US20090511846 申请日期 2009.07.29
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 HO CHIAHUA;LAI ERH-KUN;HSIEH KUANG YEU
分类号 G11C11/00 主分类号 G11C11/00
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