发明名称 EDGE TERMINATION FOR SEMICONDUCTOR DEVICES
摘要 A high-voltage termination structure includes a peripheral voltage-spreading network. One or more trench structures are connected at least partly in series between first and second power supply voltages. The trench structures include first and second current-limiting structures connected in series with a semiconductor material, and also includes permanent charge in a trench-wall dielectric. The current-limiting structures in the trench structures are jointly connected in a series-parallel ladder configuration. The current-limiting structures, in combination with the semiconductor material, provide a voltage distribution between the core portion and the edge portion.
申请公布号 WO2009148695(A2) 申请公布日期 2009.12.10
申请号 WO2009US39612 申请日期 2009.04.06
申请人 MAXPOWER SEMICONDUCTOR INC.;PAUL, AMIT;DARWISH, MOHAMED, N.;ZENG, JUN 发明人 PAUL, AMIT;DARWISH, MOHAMED, N.;ZENG, JUN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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