发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of sufficiently reducing source inductance to obtain high efficiency of heat dissipation, even when a thin and deep via hole is provided. SOLUTION: A compound semiconductor region 2 is formed on an SiC substrate 1, after that, a gate electrode 4g, a source electrode 4s, and a drain electrode 4d are formed on the compound semiconductor region 2, and an Au film 10 to be connected to the source electrode 4s is further formed on the compound semiconductor region 2. Next, the backside of the SiC substrate 1 is irradiated with a laser beam to form the via hole 21 which penetrates the SiC substrate 1, the compound semiconductor region 2, and the Au layer. Next, via wiring 14 is formed over the side of the via hole 21 and the backside of the SiC substrate 1. Next, a conduction via is formed by filling molten metal drop 32 in the via hole 21 to be solidified. Then, when the molten metal drop 32 is filled, the SiC substrate 1 is relatively oscillated to the molten metal drop 32. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009290098(A) 申请公布日期 2009.12.10
申请号 JP20080143070 申请日期 2008.05.30
申请人 FUJITSU LTD 发明人 KAMATA YOICHI;OKAMOTO NAOYA;SHIGEMATSU HISAO
分类号 H01L21/338;H01L21/302;H01L21/3205;H01L23/52;H01L29/778;H01L29/812 主分类号 H01L21/338
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