| 摘要 |
<p>Provided is a test apparatus for testing a device under test, wherein the test apparatus is comprised of a main pattern generator which generates a main pattern for testing the device under test in each testing cycle; a plurality of sub-pattern generators each of which generates a sub-pattern corresponding to each of a plurality of division cycles, which divide up the test cycle period, based on the main pattern; a test signal supply unit which supplies the device under test with a test pattern which is the plurality of sub-patterns generated by the plurality of sub-pattern generators switched and multiplexed in each of the plurality of division cycles; and a plurality of delay selection units each of which selects either to supply the main pattern from the main pattern generator or the main pattern from the main pattern generator delayed by a test cycle for each of the plurality of sub-pattern generators.</p> |
