发明名称 CHARACTERISTIC MEASURING METHOD OF LIGHT, MOUNTING POSITION ADJUSTING METHOD OF LIGHT SOURCE, CHARACTERISTIC MEASURING DEVICE OF LIGHT, AND MOUNTING POSITION ADJUSTING DEVICE OF LIGHT SOURCE
摘要 <P>PROBLEM TO BE SOLVED: To provide a characteristic measuring method of light capable of calculating accurately various characteristics of light. Ž<P>SOLUTION: The characteristics of light is calculated by this characteristic measuring method of light having: intensity calculation steps S1, S2 for taking an image of light emitted from a light source whose light intensity distribution is a Gauss distribution, and calculating the intensity of the light at optional coordinates (θx, θy) in the image; fitting steps S3, S4 for fitting a light intensity distribution in the image calculated in the intensity calculation steps S1, S2 based on formula: I(θx, θy)=EXP(aθx<SP>2</SP>+bθy<SP>2</SP>+c+hθxθy+gθx+fθy), and calculating each coefficient a, b, c, f, g and h; and a characteristic calculation step S5 for calculating the characteristics of the light based on each coefficient a-c, f-h calculated in the fitting steps S3, S4. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009288217(A) 申请公布日期 2009.12.10
申请号 JP20080144225 申请日期 2008.06.02
申请人 NIDEC SANKYO CORP 发明人 SAKAI HIROSHI
分类号 G01J1/00;G01M11/00;G11B7/08;G11B7/22 主分类号 G01J1/00
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