发明名称 DEVICE AND METHOD FOR MEASURING DEPOSIT THICKNESS IN FLUID
摘要 <P>PROBLEM TO BE SOLVED: To provide a deposit thickness measuring device and method to measure, on a real-time basis the deposit thickness of solid particles deposited on a pipe, in which fluid containing the solid particles flows when the solid particles are transported together with the fluid. Ž<P>SOLUTION: This deposit thickness measuring device includes the pipe 12, in which the fluid 2 containing the solid particles 1 flows; an electromagnetic wave emission device 14, which emits electromagnetic waves (visible light or ultraviolet rays) to a measurement part 12a of the pipe 3; an intensity distribution measurement device (CCD camera) 16, which measures the intensity distribution 4 of the electromagnetic waves having penetrated the measurement part 12a; and an arithmetic device 18 which calculates the deposit thickness of the solid particles in the measurement part from the intensity distribution of electromagnetic waves. The deposit thickness measuring device measures the intensity distribution of the transmitted electromagnetic waves, with respect to the known deposit thickness beforehand, and therefrom a relational expression of the deposit thickness and the intensity distribution of electromagnetic waves is obtained. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009287995(A) 申请公布日期 2009.12.10
申请号 JP20080139104 申请日期 2008.05.28
申请人 IHI CORP 发明人 IWASA YOSHITAKA
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
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