发明名称 SURFACE SHAPE MEASURING APPARATUS AND SURFACE SHAPE MEASURING METHOD
摘要 In a surface shape measurement device that measures the surface shape of a sample (W1, W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1, W2) and thereby detecting the amount of displacement of the probe (16, 26) caused by irregularities on the surface, an initial amount of displacement is detected which is the amount of displacement of the probe (16, 26) when the probe is first placed in contact with a measurement start point on the surface of the sample (W1, W2), and the amount of displacement of the probe (16, 26), detected as it is moved in a sliding fashion along the surface, is compared with the initial amount of displacement to determine whether the probe (16, 26) has reached a measurement end point.
申请公布号 US2009300930(A1) 申请公布日期 2009.12.10
申请号 US20080309132 申请日期 2008.05.21
申请人 ISHIKAWA YASUNARI 发明人 ISHIKAWA YASUNARI
分类号 G01B5/28 主分类号 G01B5/28
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