| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of measuring a resistance distribution of all memory cells, and thereby setting a resistance value of a reference resistor more appropriately according to the resistance distribution. SOLUTION: A resistance selection circuit 12 is connected to a plurality of reference resistance elements 11-1 to 11-n, and the plurality of reference resistance elements are selectively connected in parallel according to a control signal input to the resistance selection circuit from the outside. Resistance values of the plurality of reference resistance elements are selected so as to be changed from a smaller value to a larger value as compared with a minimum value and a maximum value of the resistance values of the memory cells. COPYRIGHT: (C)2010,JPO&INPIT |
