发明名称 Thin film transistor having double-layered gate electrode and method of manufacturing the thin film transistor
摘要 A thin film transistor (TFT) that can prevent damage to a silicon layer under a gate electrode in an annealing process by using a first gate electrode having high thermal resistance and a second gate electrode having high reflectance and a method of manufacturing the TFT are provided. The method of manufacturing a TFT includes forming a double-layered gate electrode which includes a first gate electrode formed of a material having high thermal resistance and a second gate electrode formed of a metal having high optical reflectance on the first gate electrode, and forming a source and a drain by annealing doped regions on both sides of a silicon layer under the gate electrode by radiating a laser beam onto the entire upper surface of the silicon layer.
申请公布号 US7629205(B2) 申请公布日期 2009.12.08
申请号 US20060330344 申请日期 2006.01.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO HANS S.;LIM HYUCK;NOGUCHI TAKASHI;KWON JANG-YEON
分类号 H01L21/00 主分类号 H01L21/00
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