发明名称 Bottom gate thin film transistor and method of manufacturing the same
摘要 A method of manufacturing a bottom gate thin film transistor ("TFT") in which a polycrystalline channel region having a large grain size is formed relatively simply and easily. The method of manufacturing a bottom gate thin film transistor includes forming a bottom gate electrode on a substrate, forming a gate insulating layer on the substrate to cover the bottom gate electrode, forming an amorphous semiconductor layer, an N-type semiconductor layer and an electrode layer on the gate insulating layer sequentially, etching an electrode region and an N-type semiconductor layer region formed on the bottom gate electrode sequentially to expose an amorphous semiconductor layer region, melting the amorphous semiconductor layer region using a laser annealing method, and crystallizing the melted amorphous semiconductor layer region to form a laterally grown polycrystalline channel region.
申请公布号 US7629207(B2) 申请公布日期 2009.12.08
申请号 US20070692716 申请日期 2007.03.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM HYUCK;PARK YOUNG-SOO;XIANYU WENXU;CHA YOUNG-KWAN
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
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