发明名称 Apparatus and method for controlling ion beam
摘要 An apparatus and/or method for controlling an ion beam may be provided, and/or a method for preparing an extraction electrode for the same may be provided. In the apparatus, a plurality of extraction electrodes may be disposed in a path of an ion beam. At least one extraction electrode may include a plurality of sub-grids.
申请公布号 US7629589(B2) 申请公布日期 2009.12.08
申请号 US20070703130 申请日期 2007.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG SUNG-WOOK;LEE DO-HAING;SHIN CHUL-HO;SUN JONG-WOO
分类号 G21K1/08;H01J1/36;H01J1/46 主分类号 G21K1/08
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