发明名称 ALIGN KEY AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: An align key of a semiconductor device and a method for forming the same are provided to prevent impurity from being left in the side lamp of a step portion, by forming the step portion with minimum depth when the align key is formed in a scribe lane region. CONSTITUTION: A first insulation layer(104) is formed on a semiconductor substrate(102) in a scribe lane region. An etch mask pattern is formed on the first insulation layer. An etch stopping layer(110) and a second insulation layer(112) are formed to maintain a step due to the etch mask pattern on the first insulation layer and the etch mask pattern. A conductive layer is formed in a space between the etch mask pattern. A conductive layer pattern(120b) lower than the second insulation layer is formed by performing a planarization process on the surface of the conductive layer.</p>
申请公布号 KR20090125504(A) 申请公布日期 2009.12.07
申请号 KR20080051650 申请日期 2008.06.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JONG HOON
分类号 H01L21/027 主分类号 H01L21/027
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