INSERTING JIG FOR SEMICONDUCTOR INSPECTION SYSTEM

摘要

PURPOSE: An insertion jig for a semiconductor test apparatus is provided to test a memory module safely and efficiently, by inserting the memory module into an interposer card safely. CONSTITUTION: A socket is installed on a board, and tests a dual inline memory module by loading the memory module by inserting a bottom tap of the memory module. An interposer card tests a small outline dual inline memory module. A position setting groove(111) is cut long along both sides in order for substrates in both sides of the interposer card to be inserted and installed. A cut-out part(110) forms a memory module insertion hole(112) wider than the position setting groove. A buffer part(130) is attached to the bottom along the length direction of an insertion hole. A projection part(120) with fixed depth is comprised on the top side where the buffer part is attached.