发明名称 THE PLASMA MONITORING METHOD AND THE PLASMA MONITORING APPARATUS
摘要 PURPOSE: A plasma monitoring method and an apparatus thereof are provided to monitor chamber wall state and plasma, by measuring spectrum emitted from plasma through the window of the chamber confining the plasma. CONSTITUTION: A chamber including a window and confining plasma is prepared(S100). An optical signal is generated by measuring spectrum emitted from the plasma through the window of the chamber(S200). A reference signal is extracted from the optical signal by considering transmission reduction of the window(S300). Signal variation is extracted using the reference signal and the optical signal(S400). The chamber is controlled by using the signal variation(S500). Reduction rate is calculated by using the temporal variation of the optical signal.
申请公布号 KR20090125490(A) 申请公布日期 2009.12.07
申请号 KR20080051624 申请日期 2008.06.02
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KIM, JUNG HYUNG;YOU, SHIN JAE;SEONG, DAEE JIN;SHIN, YONG HYEON
分类号 H01L21/66;H01L21/3065 主分类号 H01L21/66
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