发明名称 POLISHING METHOD OF SILICON CARBIDE SINGLE CRYSTAL WAFER SURFACE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an effective method of obtaining a surface of high quality by removing a layer deteriorated by processing from the surface of a silicon carbide single crystal wafer which has been rough-lapped for chemical stability, and then finish polishing. <P>SOLUTION: The polishing method efficiently provides a surface of high quality with no deteriorated layer by processing that occurs after diamond mechanical polishing, by oxidizing the surface of silicon carbide single crystal wafer that has been rough-lapped in diamond mechanical polishing, and then removing an oxide film on the surface by finish polishing. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009283629(A) 申请公布日期 2009.12.03
申请号 JP20080133348 申请日期 2008.05.21
申请人 NIPPON STEEL CORP 发明人 YASHIRO HIROKATSU;FUJIMOTO TATSUO;HOSHINO TAIZO;AIGO TAKASHI;KATSUNO MASAKAZU;TSUGE HIROSHI;NAKABAYASHI MASASHI;HIRANO YOSHIO;OTANI NOBORU;TATSUMI KOHEI
分类号 H01L21/304;B24B37/00;B24B39/04;C30B29/36;C30B33/00;H01L21/306 主分类号 H01L21/304
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