发明名称 Integrated circuit design method for improved testability
摘要 A display device is provided with a display panel; and a display panel driver driving the display panel in response to externally-provided image data. The display panel driver includes a display memory for storing the image data, and is configured to perform overdrive processing on the image data read from the display memory. The display panel driver includes an overdrive processing control circuit detecting writing of the image data into the display memory to control operation and halt of a circuit used for the overdrive processing.
申请公布号 US2009295813(A1) 申请公布日期 2009.12.03
申请号 US20090453930 申请日期 2009.05.27
申请人 NEC ELECTRONICS CORPORATION 发明人 NOSE TAKASHI;FURIHATA HIROBUMI
分类号 G09G5/39;G02F1/133;G09G3/20;G09G3/36 主分类号 G09G5/39
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