发明名称 |
TRENCH GATE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF. |
摘要 |
A trench-gate semiconductor device configuration is provided which is suitable for incorporation in integrated circuits, together with methods for its manufacture. A self-aligned drain region (12a) is provided below the device trench (18). The manufacturing methods include etching an initial trench into a semiconductor body (8), and annealing so as to cause migration of material such that a shallower trench with a cavity (36) below it are formed. The drain region is then formed in the cavity. A further cavity (52) may be used to form a buried isolation layer (56) below the drain region, e.g by thermal oxidation. |
申请公布号 |
WO2009144640(A1) |
申请公布日期 |
2009.12.03 |
申请号 |
WO2009IB52127 |
申请日期 |
2009.05.20 |
申请人 |
NXP B.V.;SONSKY, JAN;SAARNILEHTO, EERO |
发明人 |
SONSKY, JAN;SAARNILEHTO, EERO |
分类号 |
H01L29/78;H01L21/324;H01L21/331;H01L21/336;H01L21/74;H01L29/08;H01L29/739 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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