发明名称 TRENCH GATE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF.
摘要 A trench-gate semiconductor device configuration is provided which is suitable for incorporation in integrated circuits, together with methods for its manufacture. A self-aligned drain region (12a) is provided below the device trench (18). The manufacturing methods include etching an initial trench into a semiconductor body (8), and annealing so as to cause migration of material such that a shallower trench with a cavity (36) below it are formed. The drain region is then formed in the cavity. A further cavity (52) may be used to form a buried isolation layer (56) below the drain region, e.g by thermal oxidation.
申请公布号 WO2009144640(A1) 申请公布日期 2009.12.03
申请号 WO2009IB52127 申请日期 2009.05.20
申请人 NXP B.V.;SONSKY, JAN;SAARNILEHTO, EERO 发明人 SONSKY, JAN;SAARNILEHTO, EERO
分类号 H01L29/78;H01L21/324;H01L21/331;H01L21/336;H01L21/74;H01L29/08;H01L29/739 主分类号 H01L29/78
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