发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device can form an ohmic electrode by a low-temperature process without using an ion implantation process. SOLUTION: An element structure and a surface electrode are formed on the front surface side of an n<SP>+</SP>type substrate 1, and thereafter a polishing process is executed to the back face 1b of the n<SP>+</SP>type substrate 1 to form minute irregularity on the back face 1b. A metal thin film 110 is formed on the back face 1b with the irregularity formed thereon, and thereafter a drain electrode 11 including a silicide layer 111 is formed by irradiating the back face 1b side of the n<SP>+</SP>type substrate 1 with laser light in a condition where the product of photon energy and laser output is set to 1,000-8,000 eV mJ/cm<SP>2</SP>. Thereby, the silicide layer 111 can be created in the drain electrode 11 on the n<SP>+</SP>type substrate 1 without executing a high-temperature process to the n<SP>+</SP>type substrate 1. Accordingly, the drain electrode 11 can be formed into an ohmic electrode by a low-temperature process without using an ion implantation process. COPYRIGHT: (C)2010,JPO&amp;INPIT
申请公布号 JP2009283754(A) 申请公布日期 2009.12.03
申请号 JP20080135282 申请日期 2008.05.23
申请人 DENSO CORP 发明人 KAWAI JUN
分类号 H01L21/28;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/28
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