TEST SYSTEM, ELECTRONIC DEVICE, AND TEST APPARATUS

摘要

Provided is a test system that tests a device under test, including a plurality of internal test circuits that are provided inside the device under test and that are used for testing an operation circuit of the device under test; a device control section that is electrically connected to the plurality of internal test circuits via a common bus and that controls the plurality of internal test circuits by supplying the common bus with an intra-device control signal corresponding to a received external signal; and a test apparatus that supplies the device control section with the external signal.