发明名称 RFID INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To prevent a read error due to the influence of an adjacent RFID by a single inspecting tool even in RFIDs arranged on a continuous sheet and having different sizes or pits, in an RFID inspection system for inspecting communication of RFIDs of an IC tag, an IC label, or the like. <P>SOLUTION: The inspecting tool includes an antenna part 15 of a reader/writer and is configured by first and second shield materials 32A, 33A obtained by winding a continuous sheet 21 in a circular arc shape on which at least an RFID 22 to be inspected and an adjacent RFID 22 are formed and by forming an opening 20 on which only the RFID 22 to be inspected is arranged. Either one or both of the first and second shield materials 32A, 33A are rotatable in a partial contact state and the opening 20 corresponding to the size of the RFID 22 to be inspected is formed. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009282813(A) 申请公布日期 2009.12.03
申请号 JP20080135051 申请日期 2008.05.23
申请人 TOPPAN FORMS CO LTD 发明人 YOSHIDA RIE;OKADA TAKAAKI;SHOJI YOHEI
分类号 G06K17/00 主分类号 G06K17/00
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