发明名称 Phase change random access memory and methods of manufacturing and operating same
摘要 A phase change memory device includes a switching device, a phase change storage node connected to the switching device, and a gate electrode which is spaced apart from the phase change storage node and increases an electrical resistance of the storage node during a reset programming operation. The gate electrode may be disposed around the phase change storage node, and may be used for applying an electric field to the phase change storage node.
申请公布号 US2009296457(A1) 申请公布日期 2009.12.03
申请号 US20090455007 申请日期 2009.05.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUH DONG-SEOK
分类号 G11C11/00;H01L21/00;H01L29/02 主分类号 G11C11/00
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