发明名称 SUPPORT STRUCTURE, LITHOGRAPHIC APPARATUS AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for preventing or relieving misalignment etc. of a substrate and a patterning device. <P>SOLUTION: A support structure for supporting an exchangeable object in a lithographic exposure apparatus includes a first support structure part and a second support structure part, the first support structure part being arranged to support the object, and the second support structure part being arranged to, at least in part, support the first support structure part. At least one of the first support structure part and the second support structure part has an open-box structure. The first support structure part and the second support structure part are configured to be attached to one another in such a way that the first support structure part and the second support structure together form a closed-box structure. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009283935(A) 申请公布日期 2009.12.03
申请号 JP20090118181 申请日期 2009.05.15
申请人 ASML NETHERLANDS BV 发明人 VERMAELEN MARKUS MARTINUS PETRUS ADRIANUS;JACOBS JOHANNES HENRICUS WILHELMUS;OTTENS JOOST JEROEN
分类号 H01L21/68;B65G49/07;H01L21/027 主分类号 H01L21/68
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