发明名称 METAL STATE DETECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To avoid decline of detection accuracy caused by mutual interference, when detecting a metal state highly accurately by using the first oscillation circuit (the first detection coil) and the second oscillation circuit (the second detection coil). Ž<P>SOLUTION: This device includes the first oscillation circuit 2 for generating a phase shift in an oscillation wave corresponding to an inductance change of the first detection coil L1, the second oscillation circuit 3 for generating a phase shift in an oscillation wave corresponding to an inductance change of the second detection coil L2, and a detection circuit 4 for detecting the metal state based on each phase shift of the oscillation waves output from both oscillation circuits 2, 3. When avoiding simultaneous oscillation from the first oscillation circuit 2 and the second oscillation circuit 3, each oscillation circuit 2, 3 is switched to an oscillation state and a non-oscillation state corresponding to signal input to each gate G (an AND gate, a Schmidt NAND gate or the like) carried by each oscillation circuit 2, 3. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009281748(A) 申请公布日期 2009.12.03
申请号 JP20080131415 申请日期 2008.05.19
申请人 AZUMA SYSTEMS:KK 发明人 YAMAKAWA KAZUHIRO;KANDA TETSUO
分类号 G01L3/10;G01N27/72;G01N27/82 主分类号 G01L3/10
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