发明名称 DEFECT EVALUATION METHOD OF LONG MEMBER, AND DEFECT EVALUATION DEVICE OF LONG MEMBER
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect evaluation method and a defect evaluation device of a long member capable of evaluating easily and accurately a defect regardless of the shape of an evaluation portion. Ž<P>SOLUTION: A probe is placed on the end face of the long member, and an ultrasonic wave is transmitted therefrom, and a defect B such as thinning is evaluated by a reception signal from the long member. The probe is a phased array probe, and the phased array probe is mounted rotatably on one end of the long member. The phased array probe is rotated on the end face, and the ultrasonic wave is transmitted/received in a prescribed transmission angle range on each rotation position. An S-scan image I1 is generated from the acquired reception signal, and a B-scan image I2 is generated by piling the reception signal at an optional transmission angle in parallel in the peripheral direction of the long member, The defect B such as thinning is evaluated from a delay signal F displayed on the images I1, I2. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009281731(A) 申请公布日期 2009.12.03
申请号 JP20080130850 申请日期 2008.05.19
申请人 CHUBU ELECTRIC POWER CO INC;CHUBU PLANT SERVICE CO LTD;NON-DESTRUCTIVE INSPECTION CO LTD 发明人 MATSUZAKI AKIHIRO;OKADA HIDETSUGU;KAKO AKIHIRO;SHIROSHITA SATORU;NAGAI TATSUYUKI
分类号 G01N29/04;G01N29/24;G01N29/26;G01N29/44 主分类号 G01N29/04
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