| 摘要 |
<p>A test device for testing a device to be tested such as a semiconductor device. The test device comprises a controller for controlling the test of the device to be tested, test units for communicating signals between the test units and the device to be tested, and buffer parts which buffer an access request transmitted from the controller to the test units and issue the previously buffered access request to the side of the test units in advance of the completion of a write request to a predetermined buffer-control address from the controller.</p> |
