| 摘要 |
PURPOSE: A probe card for testing semiconductor device is provided to connect probe and main printed circuit board by using the sub PCB.. CONSTITUTION: The semiconductor device test probe card(100) inspects the semiconductor device. A plurality of slits is formed in one side of the tip bar(110) according to the longitudinal direction. The sub PCB(120) installs to the side of the tip bar. The sub PCB is connected to the main printed circuit board. The contact tip(131) is respectively installed to the slit of the tip bar. The contact tip is projected from the slit formation surface of the tip bar. The contact tip is contacted with the connection pad of the semiconductor device. The terminal tip(132) is drawn for the side of the tip bar. The terminal tip is connected to the sub PCB. A plurality of probes(130) is connected through the sub PCB to the main printed circuit board. |
