发明名称 NANOTUBE PROBE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.</p>
申请公布号 EP1666867(A4) 申请公布日期 2009.12.02
申请号 EP20040773076 申请日期 2004.09.08
申请人 NAKAYAMA, YOSHIKAZU;DAIKEN CHEMICAL CO. LTD. 发明人 NAKAYAMA, YOSHIKAZU;OKAWA, TAKASHI;YAMANAKA, SHIGENOBU;HARADA, AKIO
分类号 G01Q60/16;G01Q60/38;G01Q70/00;G01Q70/02;G01Q70/12 主分类号 G01Q60/16
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