发明名称 A LENS FOR A SCANNING ELECTRON MICROSCOPE
摘要 <p>A lens (15) for a scanning electron microscope is adapted to be removably mounted on a specimen stage (1). The lens (15) includes a magnetic circuit (2, 3, 4, 7) having a first magnetic pole piece (7) and a second magnetic pole piece (4), and a specimen holder (5). The specimen holder (5) is located between the first and second magnetic pole pieces (4, 7). The magnetic circuit (2, 3, 4, 7) also includes a lens bore (18) to permit an electron beam (9) to strike a surface of a specimen mounted on the specimen holder (5), in use. The lens bore (18) has a width of greater than 1 mm.</p>
申请公布号 WO2001084593(A2) 申请公布日期 2001.11.08
申请号 SG2001000083 申请日期 2001.05.02
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