发明名称 |
Parallel testing of semiconductor devices using a dividing voltage supply unit |
摘要 |
Provided is a method of performing a parallel test on semiconductor devices, the method including coupling a power signal line to a set of at least two semiconductor devices through a switching device, performing at least one part of a parallel test on the set of semiconductor devices, and disconnecting a semiconductor device from the set in response to determining that the semiconductor device is defective as a result of the at least one part of the parallel test.
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申请公布号 |
US7626413(B2) |
申请公布日期 |
2009.12.01 |
申请号 |
US20080185697 |
申请日期 |
2008.08.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE SANG-HOON;JI JOON-SU;AHN JUNG-BAE |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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