Photothermal modulation for oscillating mode atomic force microscopy in solution

摘要

A method of imaging a sample present in a solution by employing an atomic force microscope comprises providing an atomic force microscope having a cantilever that is under the solution, contacting the cantilever with energy to cause the cantilever to bend and vibrate, and detecting the amplitude of vibration of the cantilever from the energy. The cantilever has at least one coating present thereon to absorb energy such that the cantilever bends and vibrates.