发明名称 Process for fabricating a thin film semiconductor device, thin film semiconductor device, and liquid crystal display
摘要 A process of fabricating a thin film semiconductor device is proposed, which is suitable for mass production and enables to lower the production cost. A first substrate is subject to anodization to form a porous layer thereon. Then, a thin film semiconductor layer is formed on the porous layer. Using the thin film semiconductor layer, a semiconductor device is formed, and wiring is formed between the semiconductor devices. After that, the semiconductor devices on the first substrate is bonded to a second substrate. The semiconductor devices are separated from the first substrate. Further, the semiconductor devices are electrically insulated by removing a part of the thin film semiconductor layer from the separated surface of the second substrate.
申请公布号 US7626200(B2) 申请公布日期 2009.12.01
申请号 US20040939437 申请日期 2004.09.14
申请人 SONY CORPORATION 发明人 TAYANAKA HIROSHI
分类号 G02F1/1368;H01L31/00;G02F1/136;H01L21/00;H01L21/02;H01L21/30;H01L21/336;H01L21/68;H01L21/762;H01L23/52;H01L27/00;H01L27/12;H01L29/786 主分类号 G02F1/1368
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