发明名称 Phase-change random access memory and programming method
摘要 A programming method for a phase-change random access memory (PRAM) may be provided. The programming method may include determining an amorphous state of a chalcogenide material using programming pulses to form programming areas having threshold voltages corresponding to logic high and logic low, and/or controlling a trailing edge of programming pulses during programming to control a quenching speed of the chalcogenide material so as to adjust a threshold voltage of the chalcogenide material. Accordingly, programming pulses corresponding to logic low or logic high may have uniform magnitudes regardless of a corresponding logic level. Accordingly, reliability of a PRAM device may be improved.
申请公布号 US7626859(B2) 申请公布日期 2009.12.01
申请号 US20070657649 申请日期 2007.01.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUH DONG-SEOK;LEE EUN-HONG;NOH JIN-SEO
分类号 G11C11/00 主分类号 G11C11/00
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