发明名称 Method for accessing memory by way of step-increasing threshold voltage
摘要 A method for accessing memory is provided. The memory includes many multi-level cells each having at least a storage capable of storing 2n bits, n is a positive integer. The method for accessing memory includes the following steps: Firstly, threshold voltages of the storage are defined into 2n level respectively, wherein each of the 2n level corresponds to a storage status of n bits, and most significant bits of the storage statuses which level 0 to level 2n/2-1 correspond to are different from most significant bits of the storage statuses which level 2n/2 to level 2n-1 correspond to. Next, a target data is divided into n portions and the divided target data is written into n temporary memories respectively. Then, n bits of the target data are written into the multi-level cell. Each of the n bits data is collected from each of the n temporary memories.
申请公布号 US7626867(B2) 申请公布日期 2009.12.01
申请号 US20080174115 申请日期 2008.07.16
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 HUNG CHUN-HSIUNG;HO WEN-CHIAO;CHANG KUEN-LONG
分类号 G11C16/04 主分类号 G11C16/04
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