发明名称 Integrated circuit package with open substrate
摘要 An integrated circuit package comprises a substrate including a core layer with a through opening and vias. A first conductive layer is on the core layer covering the through opening and a second conductive layer is on the core layer opposite the first conductive layer in the through opening and in the vias contacting the first conductive layer. An integrated circuit die is bonded to the second conductive layer and in the through opening. Connections are between the integrated circuit die and the second conductive layer, and the integrated circuit die and the connections are encapsulated.
申请公布号 US7626277(B2) 申请公布日期 2009.12.01
申请号 US20050164329 申请日期 2005.11.18
申请人 ST ASSEMBLY TEST SERVICES LTD. 发明人 SHIM IL KWON;TAN KWEE LAN;LI JIAN JUN;FILOTEO, JR. DARIO S.
分类号 H01L23/48;H01L21/44;H01L21/48;H01L23/13;H01L23/498;H01L23/52;H01L25/065;H01L25/10;H01L29/40 主分类号 H01L23/48
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