发明名称 METHOD OF FORMING INSULATING FILM, AND INSULATING FILM
摘要 PROBLEM TO BE SOLVED: To obtain an insulating film which has high mechanical strength, high stability in air atmosphere, high thermal stability, and a low relative dielectric constant. SOLUTION: When the insulating film is formed by a plasma CVD method by using an insulating film material for plasma CVD made of a silicon compound, such as, dicyclopentyl dimethoxysilane and dicyclohexyl dimethoxysilane, an oxidant, such as oxygen is accompanied; a filming temperature is set to 200 to 300°C; and the insulating film is irradiated with ultraviolet rays of 200 nm or longer. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009277686(A) 申请公布日期 2009.11.26
申请号 JP20080124604 申请日期 2008.05.12
申请人 TAIYO NIPPON SANSO CORP;TRI CHEMICAL LABORATORY INC 发明人 JINRIKI MANABU;INAISHI YOSHIAKI;INOUE MINORU;JO EIKA;MACHIDA HIDEAKI
分类号 H01L21/316;C23C16/42;H01L21/768 主分类号 H01L21/316
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