发明名称 LOW CONTACT RESISTANCE SEMICONDUCTOR DEVICES AND METHODS FOR FABRICATING THE SAME
摘要 Low contact resistance semiconductor devices and methods for fabricating such semiconductor devices are provided. In accordance with one exemplary embodiment, a method comprises depositing an insulating material overlying a metal silicide region and etching a contact opening within the insulating material and exposing the metal silicide region. The contact opening is at least partially bottom-filled with substantially pure cobalt. A conductor is deposited in the contact opening if, after the step of at least partially bottom-filling, the contact opening is not filled with the substantially pure cobalt.
申请公布号 US2009289370(A1) 申请公布日期 2009.11.26
申请号 US20080124879 申请日期 2008.05.21
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BESSER PAUL R.;KNORR ANDREAS H.
分类号 H01L23/48;H01L21/336;H01L21/44 主分类号 H01L23/48
代理机构 代理人
主权项
地址