发明名称 METHODS OF LASER ANNEALING A SEMICONDUCTOR LAYER AND SEMICONDUCTOR DEVICES PRODUCED THEREBY
摘要 <p>The present invention relates methods of laser annealing a semiconductor layer and semiconductor devices produced thereby. The method includes forming a nitrogen doped layer on the semiconductor layer (200), the nitrogen doped layer having a nitrogen concentration of at least 3 x 1020 atoms/cc, irradiating a first area of the nitrogen doped layer in a low oxygen environment with a laser beam (202) and irradiating a second area of the nitrogen doped layer in a low oxygen environment with a laser beam (204), a part of the second area overlapping with a part of the first area in a product region.</p>
申请公布号 SG156537(A1) 申请公布日期 2009.11.26
申请号 SG20080028177 申请日期 2008.04.09
申请人 TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. 发明人 KIAT LIM KIAN;NAKAMURA ATSUSHI;PHENG TAN KAI;SOON LIM ENG;LING FU POH;KAMIMURA TAKAAKI
分类号 H01L21/20;H01L21/265;H01L21/336;H01L29/786 主分类号 H01L21/20
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