发明名称 |
METHODS OF LASER ANNEALING A SEMICONDUCTOR LAYER AND SEMICONDUCTOR DEVICES PRODUCED THEREBY |
摘要 |
<p>The present invention relates methods of laser annealing a semiconductor layer and semiconductor devices produced thereby. The method includes forming a nitrogen doped layer on the semiconductor layer (200), the nitrogen doped layer having a nitrogen concentration of at least 3 x 1020 atoms/cc, irradiating a first area of the nitrogen doped layer in a low oxygen environment with a laser beam (202) and irradiating a second area of the nitrogen doped layer in a low oxygen environment with a laser beam (204), a part of the second area overlapping with a part of the first area in a product region.</p> |
申请公布号 |
SG156537(A1) |
申请公布日期 |
2009.11.26 |
申请号 |
SG20080028177 |
申请日期 |
2008.04.09 |
申请人 |
TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. |
发明人 |
KIAT LIM KIAN;NAKAMURA ATSUSHI;PHENG TAN KAI;SOON LIM ENG;LING FU POH;KAMIMURA TAKAAKI |
分类号 |
H01L21/20;H01L21/265;H01L21/336;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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