发明名称 HIGH PERFORMANCE METAL GATE POLYGATE 8 TRANSISTOR SRAM CELL WITH REDUCED VARIABILITY
摘要 A static random access memory cell includes a metal hi-k layer; a poly-SiON gate stack over the metal hi-k layer; a plurality of inverters disposed within the poly-SiON gate stack; and a plurality of field effect transistors placed in the metal hi-k layer.
申请公布号 US2009290439(A1) 申请公布日期 2009.11.26
申请号 US20080125637 申请日期 2008.05.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHANG LELAND;SLEIGHT JEFFREY W.
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
主权项
地址