发明名称 |
CONTACT FORMING METHOD, METHOD FOR MANUFACTURING FOR SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing for a semiconductor device that realizes a contact having low resistivity. Ž<P>SOLUTION: The method for manufacturing includes a step of implanting a p-type or n-type impurity ion into a silicon portion of the semiconductor device that is to be made into an p-type or n-type silicon region, a step of forming a contact metal film on the surface of the contact region, following the ion implantation step, without carrying out heat treatment for activating the implanted ion, and a step of reacting the metal with the silicon portion by heating to form a silicide of the metal. It is preferable that the method include a step of activating the implanted ion by heat treatment that follows the formation of the metal film. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2009277994(A) |
申请公布日期 |
2009.11.26 |
申请号 |
JP20080129692 |
申请日期 |
2008.05.16 |
申请人 |
TOHOKU UNIV;FOUNDATION FOR ADVANCEMENT OF INTERNATIONAL SCIENCE |
发明人 |
OMI TADAHIRO;TERAMOTO AKINOBU;TANAKA HIROAKI;ISOGAI TATSUNORI |
分类号 |
H01L21/336;H01L21/265;H01L21/28;H01L29/417;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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地址 |
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