发明名称 GLASS WAVINESS INSPECTION DEVICE AND INSPECTION METHOD THEREOF
摘要 <p>The present invention discloses a glass waviness inspection device and an inspection method thereof. In the glass waviness inspection device and the inspection method thereof, when information about a shadow image contains noise due to brightness variation of light, power noise owing to instability of light or alternating current power, vibration generated while a glass moves, vibration of equipment or surroundings, etc., the noise is removed and then waviness on a surface of the glass is inspected, thereby eliminating an inspection error due to the noise, enhancing accuracy of the inspection and increasing satisfaction to products.</p>
申请公布号 WO2009142346(A1) 申请公布日期 2009.11.26
申请号 WO2008KR02949 申请日期 2008.05.27
申请人 SEMISYSCO CO., LTD.;LEE, SOON-JONG;WOO, BONG-JOO;CHOI, SEONG-JIN 发明人 LEE, SOON-JONG;WOO, BONG-JOO;CHOI, SEONG-JIN;LEE, KYOUNG-SOO
分类号 G02F1/13 主分类号 G02F1/13
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