发明名称 |
GLASS WAVINESS INSPECTION DEVICE AND INSPECTION METHOD THEREOF |
摘要 |
<p>The present invention discloses a glass waviness inspection device and an inspection method thereof. In the glass waviness inspection device and the inspection method thereof, when information about a shadow image contains noise due to brightness variation of light, power noise owing to instability of light or alternating current power, vibration generated while a glass moves, vibration of equipment or surroundings, etc., the noise is removed and then waviness on a surface of the glass is inspected, thereby eliminating an inspection error due to the noise, enhancing accuracy of the inspection and increasing satisfaction to products.</p> |
申请公布号 |
WO2009142346(A1) |
申请公布日期 |
2009.11.26 |
申请号 |
WO2008KR02949 |
申请日期 |
2008.05.27 |
申请人 |
SEMISYSCO CO., LTD.;LEE, SOON-JONG;WOO, BONG-JOO;CHOI, SEONG-JIN |
发明人 |
LEE, SOON-JONG;WOO, BONG-JOO;CHOI, SEONG-JIN;LEE, KYOUNG-SOO |
分类号 |
G02F1/13 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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