发明名称 ULTRAVIOLET (UV) RADIATION TREATMENT METHODS FOR SUBATMOSPHERIC CHEMICAL VAPOR DEPOSITION (SACVD) OF OZONE-TETRAETHOXYSILANE (O3-TEOS)
摘要 <p>ULTRAVIOLET (UV) RADIATION TREATMENT METHODS FOR SUBATMOSPHERIC CHEMICAL VAPOR DEPOSITION (SACVD) OF OZONE-TETRAETHOXYSILANE (03-TEOS) Dielectric layers are formed on a substrate by performing Subatmospheric Chemical Vapor Deposition (SACVD) of ozone-tetraethoxysilane (03-TEOS) to form a layer of 03-TEOS on the substrate, and treating the layer of 03-TEOS with ultraviolet (UV) radiation. The UV radiation treatment can increase the tensile stress in the 03-TEOS layer by reducing the amount of water in the layer. Moreover, the UV treatment may also reduce the amount of silanol in the 03-TEOS layer, which can also increase reliability of the device.</p>
申请公布号 SG156622(A1) 申请公布日期 2009.11.26
申请号 SG20090067166 申请日期 2007.03.12
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD;SAMSUNG ELECTRONICS CO. LTD;INFINEON TECHNOLOGIES AG 发明人 JUNG KIM JUN;WIDODO JOHNNY;JAE-EUN PARK;SCHENK ANDRE;GUTMANN ALOIS;HAMPP ROLAND
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