发明名称 MULTI-VARIABLE REGRESSION FOR METROLOGY
摘要 <p>A method for assessing metrology tool accuracy is described. Multi-variable regression is used to define the accuracy of a metrology tool such that the interaction between different measurement parameters is taken into account, A metrology tool under test (MTUT) and a reference metrology tool (RMT) are used to measure a set of test profiles. The MTUT measures the test profiles to generate a MTUT data set for a first measurement parameter. The RMT measures the test profiles to generate RMT data sets for the first measurement parameter, and at least a second measurement parameter. Multi-variable regression is then performed to generate a best-fit plane for the data sets. The coefficient of determination (R2 value) represents the accuracy index of the MTUT.</p>
申请公布号 SG156566(A1) 申请公布日期 2009.11.26
申请号 SG20090017633 申请日期 2009.03.16
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD 发明人 ZHAN ZHOU WEN;ZHENG ZOU;GOH JASPER;SHENG ZHOU MEI
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