发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS PRODUCTION PROCESS
摘要 <P>PROBLEM TO BE SOLVED: To provide a non-volatile semiconductor memory device that has a large charge storage amount in terms of an individual memory cell and its production process. Ž<P>SOLUTION: Two or more insulating films 12 and electrode films 13 are laminated by turns on a silicon substrate 11 to form a laminated body 14. Then, a via hole 15 that goes through the laminated body 14 in a direction of lamination is formed. At this time, a side surface 15a of the part located inside the electrode film 13 in the via hole 15 is curved in a concave shape when seen from the inside of the via hole 15 at its cross-section including the central axis 15c of the via hole 15. After that, a charge storage layer 26 is formed on the side surface of the via hole 15, and a semiconductor pillar 17 is formed in the interior of the via hole 15. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009277770(A) 申请公布日期 2009.11.26
申请号 JP20080125856 申请日期 2008.05.13
申请人 TOSHIBA CORP 发明人 ISHIKAWA KATSURO;YAHASHI KATSUNORI
分类号 H01L21/8247;H01L21/3065;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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