发明名称 SEMICONDUCTOR DEVICE HAVING TRI-GATE STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device of an example of the invention comprises a memory cell and a select gate transistor provided for the memory cell. A gate electrode of the select gate transistor has a Tri-gate structure in which an upper surface of a gate insulating film formed above a channel of the select gate transistor is set higher than a portion of an upper surface of an element isolation region of the select gate transistor.
申请公布号 US2009289293(A1) 申请公布日期 2009.11.26
申请号 US20090470030 申请日期 2009.05.21
申请人 IZUMIDA TAKASHI;KANEMURA TAKAHISA;AOKI NOBUTOSHI 发明人 IZUMIDA TAKASHI;KANEMURA TAKAHISA;AOKI NOBUTOSHI
分类号 H01L29/788;H01L21/28 主分类号 H01L29/788
代理机构 代理人
主权项
地址