摘要 |
PROBLEM TO BE SOLVED: To provide a characteristic impedance inspection device for determining the degree of appropriateness of manufacturing process conditions by extracting a parameter characterizing a waveform from the measured waveform of characteristic impedance. SOLUTION: This characteristic impedance inspection device for inspecting the characteristic impedance of a circuit wiring board, comprises a measurement means capable of displaying the measured waveform of the characteristic impedance, and a waveform processing means for extracting a parameter characterizing measured waveform data from the waveform data, approximately expressing the measured waveform by using a linear expression within a preset time span, and being capable of extracting its slope and intercept. COPYRIGHT: (C)2005,JPO&NCIPI
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