发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element which has favorable crystallinity and has high performance with respect to S value. SOLUTION: A single crystal semiconductor substrate including an embrittlement layer is attached to a base substrate with an insulating layer interposed therebetween, and the single crystal semiconductor layer is separated at the embrittlement layer by heat treatment; accordingly, a single crystal semiconductor layer is fixed over the base substrate. The single crystal semiconductor layer is irradiated with a laser beam so that the single crystal semiconductor layer is partially melted and then is re-single crystallized, whereby crystal defects are removed. In addition, an island-shaped single crystal semiconductor layer for forming an n-channel transistor is channel-doped using a photomask and then is etched back using the photomask so that the island-shaped single crystal semiconductor layer for forming an n-channel transistor is thinner than an island-shaped single crystal semiconductor layer for forming a p-channel transistor. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2009278073(A) |
申请公布日期 |
2009.11.26 |
申请号 |
JP20090095442 |
申请日期 |
2009.04.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ONUMA HIDETO;NOMURA NORITSUGU |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L21/322;H01L21/336;H01L27/08;H01L27/12;H01L29/786 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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