| 摘要 |
PROBLEM TO BE SOLVED: To solve a problem wherein, when the area of a pixel region is very large and the influence of a load of a vertical signal line cannot be neglected, it is difficult to provide a test signal to an AD converter as a high-accuracy signal. SOLUTION: In this solid-state image pickup device 1, vertical signal lines 14-1 to 14-n are separated from inputs of the AD converter 7 by a vertical signal line connection circuit 20 in order to prevent a test signal TEST provided to the AD converter 7 from being influenced by the load of the pixel region 4, and the test signal TEST is allowed to be directly input to the AD converter 7 by a test signal input circuit 11 without passing through the vertical signal lines 14-1 to 14-n. COPYRIGHT: (C)2010,JPO&INPIT
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