| 摘要 |
A method for automated searching of signal characteristics represented in a bitmap of an RF test and measurement device is provided. The bitmap is populated via sampling of a time-varying signal, where a first signal characteristic is reflected by an X-axis of the bitmap, a second signal characteristic is reflected by a Y-axis of the bitmap, and a third signal characteristic is reflected by a Z-axis of the bitmap. The method includes: selecting a region of the bitmap. The method further includes generating, for the region, a histogram of Z-values of the bitmap versus Y-values of the bitmap, searching the histogram for any portion in the histogram that meets a predetermined search criteria, and identifying a location of the bitmap corresponding to each portion of the histogram that meets the predetermined search criteria.
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