发明名称 Method for irradiating sample with light in stimulated emission depletion-fluorescent light microscope, involves synchronizing polarizations of input light beams to beam splitter such that partial beams interferes in common focus point
摘要 <p>The method involves using a polarization beam splitter (24) as a beam splitter, and adjusting polarizations of two pairs of partial beams between the polarizing beam splitter and lenses (28, 29) such that the partial beams interfere in a region of a common focal plane (30). Polarizations of input light beams (13, 14) that are different from each other are synchronized to the polarization beam splitter such that one pair of partial beams interferes in a common focus point (22) with a phase that is offset relative to another phase by pi. An independent claim is also included for a fluorescent light microscope comprising a light unit for irradiating a sample with light.</p>
申请公布号 DE102008019957(A1) 申请公布日期 2009.11.26
申请号 DE20081019957 申请日期 2008.04.21
申请人 MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V. 发明人 HELL, STEFAN;EGNER, ALEXANDER;SCHMIDT, ROMAN
分类号 G02B21/06 主分类号 G02B21/06
代理机构 代理人
主权项
地址